Instrument >> Instrument for Solar Cell >> Wafer and Cells PL System:HS-PL
                

 

       Photoluminescence (PL) Imaging is a unique non-invasive inspection tool as it can be used in-line at many different steps of the cell manufacturing process. This facilitates the direct comparison of data obtained at one process step to data obtained at another. Additionally, PL imaging can be compared to electroluminescence (EL) imaging on finished cells using comparable equipment.
 
Product's Feature:
Application:
Mono crystal silicon wafers and cells,
Poly crystal silicon wafers and cells
Thin film cells
Compounds cells
Capabilities:
Minority carrier lifetime scan
Silicon classification
Series resistance
Micro cracked
IV curve in dark and light conditions
In-Line PL Imaging Benefits
  - Screen every wafer at in-line speeds 
  -Obtain information across entire wafer - not just at discrete points
  -Identify Anomalous Cause Variations
  -Identify and Track Defect Mitigation
Define and Identify
  -Responsible for low lowering yield and degrading efficiency 
  -Characterize wafers from processes steps.
Measure and Analyze 
  -Obtain photoluminescence PL imagery of processing steps 
  -Track wafers through all processing steps 
  -Collate information for use in predictive model
  -Tailored in-line design
Improve and Control 
  -Integrate in-line equipment into production line 
  -Continuous improvement monitoring processes 
Used for electroluminescence imaging on finished cells
Only process good material
Cost effectively improve throughput
Maximize average cell efficiencies
Tighten cell efficiency distribution
Identify common and special cause variations in real-time  
We provide more than inspection equipment.


 

Indium gallium arsenide sensor :900-1500nm
Size: 23mm * 23mm ~ 200mm * 200mm
Pixels: 752 × 480pixel
Testing time<1s

 

 

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