Instrument >> Instrument for CZ&DSS >> Minority Carrier Life Time System:MWR-SIM
                


       MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.
 
Product's Feature:
Non-contact and non-invasive measurement
Portable measure head
Materials: Si, Ge
Application:
Material quality control
Incoming ingot & wafer inspection
Heavy metal contamination detection inprocessed wafers
 


Typical Customer:
American,Europe and Asia and so on.

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